Method for Determining the Maximum Emission Depth of True Secondary Electrons by Means of Retarding Characteristics
- 1 November 1970
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 41 (12), 4823-4825
- https://doi.org/10.1063/1.1658546
Abstract
A method has been developed to determine the maximum emission depth of true secondary electrons λ. The method is based on observing the retarding potential characteristics as a function of film thickness of a specimen which was deposited on a substrate. With this method values of λ for DC-705, DC-704, and Octoil-S (diffusion pump oils) were determined to be about 30, 40, and 70 Å, respectively. No clear dependence of the λ on primary-electron energy was found for 200–1500 eV. These λ values well agree those obtained by means of δ-η analysis. This fact gives an experimental evidence for the validity of δ-η analysis in which a film thickness where a break occurs on a δ-η curve is assumed to correspond to λ.Keywords
This publication has 10 references indexed in Scilit:
- Secondary Electron Emission from DC-704 and Octoil-SJapanese Journal of Applied Physics, 1970
- Slow electron scattering from metals: I. The emission of true secondary electronsSurface Science, 1969
- Secondary Electron Emission from Diffusion Pump Oils II. δ-η Analysis for DC-705Japanese Journal of Applied Physics, 1968
- Secondary Electron Emission from Diffusion Pump Oils. IJapanese Journal of Applied Physics, 1967
- Secondary Emission Studies on Ge and Na-Covered GeJournal of Applied Physics, 1967
- Vapour Pressures of Vacuum Pump OilsSHINKU, 1965
- Energy Distribution of Secondary Electrons from MgO Single CrystalsPhysical Review B, 1957
- Energy Spectra of Secondary Electrons from Mo and W for Low Primary EnergiesPhysical Review B, 1956
- Secondary Electron Emission of Crystalline MgOPhysical Review B, 1953
- Zur Energieverteilung der Sekundärelektronen II. Meßergebnisse und DiskussionAnnalen der Physik, 1947