Characterisation of implanted and evaporated layers by RBS analysis
- 1 June 1982
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 197 (1), 51-57
- https://doi.org/10.1016/0167-5087(82)90117-x
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- The measurement of large-volume air-particulate samples by PIXE analysisNuclear Instruments and Methods, 1981
- PIXE analysis of aerosol samples collected over the atlantic ocean from a sailboatNuclear Instruments and Methods, 1981
- PIXE calibration and absorption corrections with the aid of proton scatteringNuclear Instruments and Methods, 1981
- Calibration and long-term stability of a PIXE set-upNuclear Instruments and Methods, 1981
- The validation of a pixe system for trace element analysis of biological samplesNuclear Instruments and Methods, 1981
- Valuable WetlandsScience News, 1981
- Particle-induced x-ray emission (PIXE) analysis of biological materials: Precision, accuracy and application to cancer tissuesNuclear Instruments and Methods, 1980
- Ion beam monitoring using thin self-supporting reference foilsNuclear Instruments and Methods, 1980
- Thin film X-ray fluorescence calibration standardsNuclear Instruments and Methods, 1979
- Preparation of standard layers by vacuum evaporationNuclear Instruments and Methods, 1972