A UHV STM for in situ characterization of MBE/CVD growth on 4-inch wafers

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1 March 1998

journal article
research article
Published by Springer Nature in Applied Physics A

Vol. 66 (7), S993-S997
https://doi.org/10.1007/s003390051282

Abstract

No abstract available

Keywords

PACS: 07.79.C; 81.15.H

Cited by 14 articles