Fabrication and characterization of solid-state nanopores using a field emission scanning electron microscope
- 6 March 2006
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 88 (10)
- https://doi.org/10.1063/1.2179131
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- DNA-Mediated Fluctuations in Ionic Current through Silicon Oxide Nanopore ChannelsNano Letters, 2004
- DNA molecules and configurations in a solid-state nanopore microscopeNature Materials, 2003
- Fabrication of solid-state nanopores with single-nanometre precisionNature Materials, 2003
- Characterization of individual polynucleotide molecules using a membrane channelProceedings of the National Academy of Sciences, 1996
- Electron beam irradiation of n-type porous silicon obtained by photoelectrochemical etchingApplied Physics Letters, 1995
- Photoinduced hydrogen loss from porous siliconApplied Physics Letters, 1992
- Study of Scanning Electron Microscope Irradiated Damage to Gate Oxides of Metal Oxide Semiconductor Field Effect TransistorsJapanese Journal of Applied Physics, 1992
- Ion-irradiation control of photoluminescence from porous siliconApplied Physics Letters, 1991
- Atomic sputtering in the Analytical Electron MicroscopeUltramicroscopy, 1989
- Processing and quantification of X-ray Energy-Dispersive Spectra in the Analytical Electron MicroscopeUltramicroscopy, 1989