A rapid approximate method for correcting low-angle scattering measurements for the influence of the finite height of the X-ray beam
- 2 March 1950
- journal article
- Published by International Union of Crystallography (IUCr) in Acta Crystallographica
- Vol. 3 (2), 158-159
- https://doi.org/10.1107/s0365110x50000343