Silicon-On-Sapphire (SOS) Monolithic Transceiver Module Components for L- and S-Band
- 23 March 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
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This publication has 1 reference indexed in Scilit:
- A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage ErrorsIEEE Transactions on Microwave Theory and Techniques, 1977