Improvements in resistance scaling at NIST using cryogenic current comparators
- 1 April 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 42 (2), 126-130
- https://doi.org/10.1109/19.278534
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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