On the Improvement of Resolution in Electron Diffraction Cameras

Abstract

An electron optical system is described in which it is possible to obtain (1) high resolution electron diffraction patterns, (2) shadow electron microscope images, and (3) electron diffraction patterns of selected variable areas of the specimen. The change in mode of operation of the system is accomplished by electrical adjustments without changing the specimen position in any way. A number of phenomena related to the attainment of high resolution diffraction patterns are described. Pertinent details of the experimental apparatus are discussed and some representative results are shown.