In situ reflection high energy electron bombardment analysis of biaxially oriented yttria-stabilized zirconia thin film growth on amorphous substrates
- 1 June 1997
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 301 (1-2), 28-34
- https://doi.org/10.1016/s0040-6090(96)09543-0
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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