Studies of Micron Order Defects in Quartz by a High Angular Resolved X-Ray Small Angle Scattering Technique

Publisher Website

1 January 1980

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 14-24
https://doi.org/10.1109/freq.1980.200379

Abstract

No abstract available

Keywords

Cited by 1 article