MAGNETIC FIELD MEASUREMENTS IN THE SCANNING ELECTRON MICROSCOPE
- 15 October 1968
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 13 (8), 249-250
- https://doi.org/10.1063/1.1652595
Abstract
The scanning electron microscope has been used to obtain quantitative values for the fields and field gradients emerging from magnetic heads or tapes. The microscope is used to image a known reference detail adjacent to the field source and the fields are computed from the resultant pattern distortion. Gradients are obtained by measuring the resultant astigmatism of the scanning beam. Fields down to 10 Oe were measured from a tape recorded at 100 cycles/cm.Keywords
This publication has 2 references indexed in Scilit:
- The direct observation of domain structure and magnetic fields in the scanning electron microscopeJournal of Scientific Instruments, 1967
- The variation with temperature of the magnetic leakage field in cobaltProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1958