Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness
- 1 September 1970
- journal article
- other
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 29 (3), 806
- https://doi.org/10.1143/jpsj.29.806
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. I. General Considerations on CollimatorsJournal of the Physics Society Japan, 1970
- Experimental Evidence of Plane Wave Rocking Curve OscillationsPhysica Status Solidi (b), 1969
- Assessment of accuracy in powder intensity measurementActa Crystallographica Section A Foundations and Advances, 1969
- Variation with Thickness in the Profile of Laue-Case Diffraction Curve of X-Rays from a Thin Si CrystalJournal of the Physics Society Japan, 1968
- X-ray Pendellösung fringes in Darwin reflectionActa Crystallographica Section A, 1968
- Über Gruppengeschwindigkeit, Energiestromdichte und Energiedichte in der Röntgen- bzw. Lichtoptik der KristalleThe European Physical Journal A, 1959