Controlled atmosphere electron microscopy

Abstract

The use of a gas-reaction stage in an electron microscope extends the range of applications for the instrument and provides a new tool for the study of reaction mechanism in many chemical systems. A JEM 7A high resolution electron microscope has been adapted to incorporate a modified JEOL AGI gas reaction attachment. The technique developed allows for continuous observation of reactions between gases and solids at temperatures up to 1500 K and pressures of up to 30 kN m^-2. Continuous recording of the transmission image by a simple video system provides immediate recall and a record which is readily available for subsequent detailed analysis. The limitations and advantages of the technique are critically assessed.