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Theoretical, practical and analogical limits in ULSI
Home
Publications
Theoretical, practical and analogical limits in ULSI
Theoretical, practical and analogical limits in ULSI
JM
J.D. Meindl
J.D. Meindl
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1 January 1983
conference paper
Published by
Institute of Electrical and Electronics Engineers (IEEE)
p.
8-13
https://doi.org/10.1109/iedm.1983.190428
Abstract
No abstract available
Keywords
ULTRA LARGE SCALE INTEGRATION
VERY LARGE SCALE INTEGRATION
VOLTAGE
INTEGRATED CIRCUIT INTERCONNECTIONS
CMOS TECHNOLOGY
SEMICONDUCTOR DEVICE MEASUREMENT
SILICON
MATERIAL PROPERTIES
INFORMATION PROCESSING
LOGIC DESIGN
Cited by 28 articles