Shear Modulation Force Microscopy Study of Near Surface Glass Transition Temperatures
- 11 September 2000
- journal article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 85 (11), 2340-2343
- https://doi.org/10.1103/physrevlett.85.2340
Abstract
We report results of glass transition (T(g)) measurements for polymer thin films using atomic force microscopy (AFM). The AFM mode, shear modulation force microscopy (SMFM), involves measuring the temperature-dependent shear force on a tip modulated parallel to the sample surface. Using this method we have measured the surface T(g) of thin (17-500 nm) polymer films and found that T(g) is independent of film thickness (t>17 nm), strength of substrate interactions, or even presence of substrate.Keywords
This publication has 26 references indexed in Scilit:
- Correlation of Nanowear Patterns to Viscoelastic Response in a Thin Polystyrene MeltLangmuir, 1998
- Study of the surface glass transition behaviour of amorphous polymer film by scanning-force microscopy and surface spectroscopyPolymer, 1998
- Effect of Free Surfaces on the Glass Transition Temperature of Thin Polymer FilmsPhysical Review Letters, 1996
- Polymer Mobility in Thin FilmsMacromolecules, 1996
- Positronium Formation as a Probe of Polymer Surfaces and Thin FilmsPhysical Review Letters, 1995
- A parametric elastic model for indentation testing of thin filmsJournal of Physics D: Applied Physics, 1993
- Ellipsometric study of the glass transition and thermal expansion coefficients of thin polymer filmsJournal of Polymer Science Part B: Polymer Physics, 1993
- Segregation of chain ends to polymer melt surfaces and interfacesMacromolecules, 1993
- Effects of molecular weight and chain ends on glass transition of polystyrenePolymer, 1975
- Viscoelastic behavior of low molecular weight polystyreneJournal of Polymer Science Part A-2: Polymer Physics, 1971