The effect of injecting contacts on avalanche diode performance

Abstract

Metal-semiconductor contact injection on the junction side of diffused-mesa avalanche diodes has been found to have a significant effect on the performance of these diodes as oscillators. A minority carrier injection ratio of 6 percent reduces the efficiency of what would be 9 percent efficient diodes to less than 1 percent and increases the FM noise by a factor of 2 as tested in a 6-GHz oscillator circuit. The dependence of the minority carrier injection ratio of the metal-semiconductor barrier upon current density has been measured and quantitatively modeled. Calculated values of diode admittance, including the effects of injection at the contact, are shown to be in agreement with measured values of both small-signal diode admittance versus frequency and large-signal diode admittance versus RF voltage. Germanium avalanche diodes with low-minority carrier injection contacts have demonstrated CW oscillation efficiencies greater than 9 percent at 6 GHz. The realization of low-injection contacts is shown to be a requirement for achievement of high-efficiency avalanche oscillation.