Recent Development and Application of the XSTM
- 1 June 1998
- journal article
- research article
- Published by World Scientific Pub Co Pte Ltd in Surface Review and Letters
- Vol. 05 (03n04), 797-802
- https://doi.org/10.1142/s0218625x98001171
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Scanning tunneling microscopy of semiconductor surfacesSurface Science Reports, 1996
- Scanning tunneling microscopy and spectroscopy of cleaved and annealed Ge(111) surfacesSurface Science, 1991
- Reconstruction of steps on the Si(111)2×1 surfacePhysical Review Letters, 1987
- Imaging electronic surface states in real space on the Si(111) 2×1 surfaceJournal of Vacuum Science & Technology A, 1987
- Tunneling spectroscopy of the Si(111)2 × 1 surfaceSurface Science, 1987
- Electronic Structure of the Si(111)2 × 1 Surface by Scanning-Tunneling MicroscopyPhysical Review Letters, 1986
- Real-space observation ofπ-bonded chains and surface disorder on Si(111)2×1Physical Review Letters, 1986
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982
- A new theoretical and practical approach to the multislice methodActa Crystallographica Section A, 1977
- Structural Properties of Cleaved Silicon and Germanium SurfacesJournal of Applied Physics, 1963