Optical reflectance studies of chemisorption on a clean metal surface
- 1 May 1973
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 12 (9), 825-828
- https://doi.org/10.1016/0038-1098(73)90087-2
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Cesium Adsorption on W: Ellipsometry, Auger Spectroscopy, and Surface Potential Difference StudiesJournal of Applied Physics, 1972
- Spectrophotometric determination of the optical properties of an adsorbed oxygen layer on goldSurface Science, 1971
- Low energy electron diffraction study of O2 and H2S adsorption on Mo (100)Journal of Crystal Growth, 1971
- Optical Properties of Molybdenum and Ruthenium*Journal of the Optical Society of America, 1970
- Ellipsometry—LEED study of the adsorption of oxygen on (011) tungstenSurface Science, 1969
- Ellipsometric investigation of chemisorption on clean silicon (111) and (100) surfacesSurface Science, 1969
- Low-Energy Electron-Diffraction Studies of the Interaction of Oxygen with a Molybdenum (100) SurfaceThe Journal of Chemical Physics, 1969
- A Normal Incidence Scanning Reflectometer of High PrecisionApplied Optics, 1969
- Optical Properties of Some Transition Metals*Journal of the Optical Society of America, 1968
- Measurement of oxygen adsorption on silicon by ellipsometryJournal of Physics and Chemistry of Solids, 1965