Quantitative Analysis of LEED Measurements
- 1 January 1983
- journal article
- Published by IOP Publishing in Physica Scripta
- Vol. T4, 22-28
- https://doi.org/10.1088/0031-8949/1983/t4/004
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
- Multilayer relaxation of the Al(110) surfaceJournal of Physics C: Solid State Physics, 1982
- Oscillatory Relaxation of the Cu(110) SurfacePhysical Review Letters, 1982
- ErratumSurface Science, 1982
- The surface structure of V(100)Surface Science, 1982
- r-factor analysis of the effect of non-structural parameters in LEED, applied to Al(111)Journal of Physics C: Solid State Physics, 1982
- The preparation and surface structure of clean V(110)Surface Science, 1981
- Reliability factors for LEED calculationsJournal of Physics C: Solid State Physics, 1980
- Quantitative analysis of low-energy-electron diffraction: Application to Pt(111)Physical Review B, 1979
- Surface structure refinements of 2HMoS2, 2HNbSe2 and W(100)p(2 × 1)O via new reliability factors for surface crystallographySurface Science, 1977
- A reliability factor for surface structure determinations by low-energy electron diffractionSurface Science, 1977