Instrumentation for surface studies: XPS angular distributions
- 31 December 1974
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 5 (1), 725-754
- https://doi.org/10.1016/0368-2048(74)85048-6
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Ultrasoft-X-Ray Reflection, Refraction, and Production of Photoelectrons (100-1000-eV Region)Physical Review A, 1972
- Escape Depths of X-ray Excited ElectronsPhysica Scripta, 1972
- Angular distribution of photoelectrons from a metal single crystalPhysics Letters A, 1971
- Angular distribution of electrons in ESCA spectra from a single crystalPhysics Letters A, 1970
- Angular dependences in electron-excited auger emissionSurface Science, 1969
- ENHANCEMENT OF SENSITIVITY IN ESCA SPECTROMETERSApplied Physics Letters, 1968