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Structural studies of thin nickel films on silicon surfaces
Home
Publications
Structural studies of thin nickel films on silicon surfaces
Structural studies of thin nickel films on silicon surfaces
WS
W. J. Schaffer
W. J. Schaffer
RB
R. W. Bené
R. W. Bené
RW
R. M. Walser
R. M. Walser
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1 July 1978
journal article
Published by
American Vacuum Society
in
Journal of Vacuum Science and Technology
Vol. 15
(4)
,
1325-1331
https://doi.org/10.1116/1.569760
Abstract
No abstract available
Keywords
NICKEL
Cited by 24 articles