Utilisation en microscopie électronique des pertes d'énergie des électrons pour l'analyse chimique locale
- 1 January 1976
- journal article
- Published by EDP Sciences in Revue de Physique Appliquée
- Vol. 11 (1), 101-111
- https://doi.org/10.1051/rphysap:01976001101010100
Abstract
Energy loss analysis in the electron microscope is useful for studying the electronic structure of thin films : the free electron densities in the valence bands are related to the plasmon losses. In particular, the distribution of known types of impurities can be determined in alloys. Deep inner shell excitation yields a method of chemical microanalysis : the sensitivity is now about 5 x 10-3. Applications for moon dust particles will be shown.Keywords
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