Automated lattice parameter measurement from HOLZ lines and their use for the measurement of oxygen content in YBa2Cu3O7-δ from nanometer-sized region
- 31 May 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 41 (1-3), 211-223
- https://doi.org/10.1016/0304-3991(92)90110-6
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Automated structure factor refinement from convergent-beam patternsUltramicroscopy, 1991
- Perturbation theory in high-energy transmission electron diffractionActa Crystallographica Section A Foundations of Crystallography, 1991
- Principles and applications of convergent beam electron diffraction: A bibliography (1938-1990)Journal of Electron Microscopy Technique, 1991
- Errors and correction term for holz line simulationsUltramicroscopy, 1989
- The simulation of HOLZ line positions in electron diffraction patterns: a first order dynamical correctionJournal of Microscopy, 1989
- Two-beam features in electron diffraction patterns – application to refinement of low-order structure factors in GaAsActa Crystallographica Section A Foundations of Crystallography, 1988
- Higher order Laue zone effects in electron diffraction and their use in lattice parameter determinationProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1977
- Bloch waves and higher order Laue zone effects in high energy electron diffractionProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1976
- The application of non-systematic many-beam dynamic effects to structure factor determinationActa Crystallographica Section A, 1971
- A method to determine the ratio between lattice parameter and electron wavelength from Kikuchi line intersectionsActa Crystallographica Section A, 1969