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A transitive closure based algorithm for test generation
Home
Publications
A transitive closure based algorithm for test generation
A transitive closure based algorithm for test generation
SC
Srimat T. Chakradhar
Srimat T. Chakradhar
VA
Vishwani D. Agrawal
Vishwani D. Agrawal
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1 January 1991
conference paper
Published by
Association for Computing Machinery (ACM)
p.
353-358
https://doi.org/10.1145/127601.127693
Abstract
No abstract available
Cited by 23 articles