On the determination of surface recombination velocity from the transient response of MIS structures
- 31 August 1970
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 13 (8), 1204-1205
- https://doi.org/10.1016/0038-1101(70)90133-4
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Surface recombination in semiconductorsSurface Science, 1968
- On the determination of minority carrier lifetime from the transient response of an MOS capacitorIEEE Transactions on Electron Devices, 1967