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Low-temperature substrate current characterization of N-channel MOSFET's
Home
Publications
Low-temperature substrate current characterization of N-channel MOSFET's
Low-temperature substrate current characterization of N-channel MOSFET's
DL
D. Lau
D. Lau
GG
G. Gildenblat
G. Gildenblat
CS
C.G. Sodini
C.G. Sodini
DN
D.E. Nelsen
D.E. Nelsen
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1 January 1985
proceedings article
Published by
Institute of Electrical and Electronics Engineers (IEEE)
https://doi.org/10.1109/iedm.1985.191034
Abstract
No abstract available
Keywords
DEGRADATION
EMPIRICAL MODEL
GEOMETRY
ELECTRONS
VOLTAGE
MEAN FREE PATH
ELECTRIC FIELD
Cited by 19 articles