Modeling of a GaN-based light-emitting diode for uniform current spreading
- 11 September 2000
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 77 (12), 1903-1904
- https://doi.org/10.1063/1.1311819
Abstract
The characteristics of the GaN/InGaN multiquantum-well light-emitting diode (LED) have been examined from the view point of uniform current spreading. By means of simple modeling, it was found that the current density and the length of the lateral current path through the transparent layer represent dominant parameters in determining uniform current spreading. In this regard, we studied the effect of current density on the reliability characteristics of the LED. We were able to significantly improve the electrical, optical, and reliability characteristics of the LED in terms of reducing the length of the lateral current path through the transparent layer.Keywords
This publication has 6 references indexed in Scilit:
- Electromigration-induced failure of GaN multi-quantum well light emitting diodeElectronics Letters, 2000
- Indium tin oxide contacts to gallium nitride optoelectronic devicesApplied Physics Letters, 1999
- InGaN blue light-emitting diodes with optimized n-GaN layerPublished by SPIE-Intl Soc Optical Eng ,1999
- High-efficiency InGaN MQW blue and green LEDsJournal of Crystal Growth, 1998
- The Blue Laser DiodePublished by Springer Nature ,1997
- Candela-class high-brightness InGaN/AlGaN double-heterostructure blue-light-emitting diodesApplied Physics Letters, 1994