Two-dimensional analysis of triode-like operation of junction gate FET's

Abstract

Triode-like operation of junction gate FET's is analyzed by two-dimensional computer simulation. Triode-like characteristics are shown to appear with the channel normally off and the depletion layer reaching the drain electrode. Triode-like current arises from carrier injection from the source electrode into the depleted region. Triode-like operation is achieved without intrinsic material.