STIMULATED EMISSION IN In1 -xGaxP

Abstract
By a modified Bridgman solution‐growth technique employing a small temperature gradient. InP and GaP source crystal are used to saturate an In solution at ∼ 925°C and grow In1−xGaxP (x ∼ 0.3) at ∼ 925°C. This material is shown to exhibit stimulated emission.