Corrections for the angle dependence of Lorentz polarization and structure factors in X-ray diffraction line profiles

Abstract

In accurate line profile analysis, corrections have to be made for the angle dependence of the Lorentz and polarization factors. These corrections should be performed before the deconvolution procedure if the spectral broadening dominates in the instrumental line profile, but after the deconvolution procedure if instrumental factors dominate the instrumental line profile. The different formulae to be applied for the Lorentz-polarization factor are indicated. The correction for the angle dependence of the structure factor should always be performed after the deconvolution procedure.