Normal-mode analysis of anisotropic and gyrotropic thin-film waveguides for integrated optics

Abstract

This paper is concerned with thin‐film optical waveguides using anisotropic and gyrotropic materials, which may play an important role in the field of integrated optics. As a fundamental problem on such waveguides, normal (propagating) modes are analyzed here by the Rayleigh‐Ritz variational technique. The analysis can be interpreted directly in terms of coupling of normal modes of the basic guide with simpler material parameters. Results are placed in the form of a matrix eigenvalue problem suitable for computer calculation, whose eigenvalues and eigenvectors lead to propagation constants and field expansion coefficients, respectively. Characteristics of anisotropic guides are discussed and compared with those of conventional isotropic guides. As a typical application TE↔TM mode converters are analyzed in some detail and numerical examples are presented.