Techniques for field-ion microscopy of copper, gold and aluminium
- 1 October 1972
- Vol. 22 (10), 447-451
- https://doi.org/10.1016/0042-207x(72)90217-5
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Formation and migration of artifact vacancies induced on gold surfaces by neon field ion microscopySurface Science, 1971
- Use of a channelled image intensifier in the field-ion microscopeJournal of Physics E: Scientific Instruments, 1969
- The effect of polarization, field stress, and gas impact on the topography of field evaporated surfacesSurface Science, 1964
- Determination of Field Strength for Field Evaporation and Ionization in the Field Ion MicroscopeJournal of Applied Physics, 1961