Barrier formation in lead-based tunnel junctions studied by surface techniques
- 1 March 1975
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 11 (2), 763-765
- https://doi.org/10.1109/tmag.1975.1058704
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Josephson Tunneling Barriers by rf Sputter Etching in an Oxygen PlasmaJournal of Applied Physics, 1971
- Stress Relief and Hillock Formation in Thin Lead FilmsJournal of Applied Physics, 1970
- Thermal Cycling and Surface Reconstruction in Aluminum Thin FilmsJournal of the Electrochemical Society, 1969