Thickness dependence of the quantum yield and attenuation length of photoelectrons in thin indium films
- 16 March 1971
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 4 (3), K187-K191
- https://doi.org/10.1002/pssa.2210040335
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Determination de la profondeur d'extraction des photoelectrons dans les couches minces de germaniumOptics Communications, 1970
- Optical properties of indium from thin film measurementsThin Solid Films, 1969
- The attenuation length of photoelectrons in thin films of uraniumPhysica Status Solidi (b), 1968
- Escape Depth for Excited Photoelectrons in KBr FilmsJournal of Applied Physics, 1967
- Attenuation Length Measurements of Photoexcited Electrons in CuBr FilmsJournal of Applied Physics, 1966
- Range-energy relation of hot electrons in goldSolid-State Electronics, 1964