Further experimental data on stress and thermal gradient compensated crystals

1 January 1977

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 65 (2), 282-284
https://doi.org/10.1109/PROC.1977.10475

Abstract

Recent interest in a quartz-crystal cut, which is compensated for stress effects and thermal gradient effects on its frequency characteristics, has required further experimental confirmation of its suitability for high-precision frequency standards. Presented in this note are experimental data on the performance of 51 units fabricated in the vicinity of (yxwl) 21.93°/33.93° along with mode spectra plots and temperature-performance data for a typical quartz resonator.

Keywords

THERMAL STRESSES
CRYSTALS
FREQUENCY
TEMPERATURE
TESTING
ELECTRODES
DIFFRACTION
ELECTRICAL RESISTANCE MEASUREMENT
MEASUREMENT UNITS
LABORATORIES

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