Modeling and simulation of coupled lossy lines for VLSI interconnections

Publisher Website

6 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iccd.1988.25664

Abstract

No abstract available

Keywords

This publication has 9 references indexed in Scilit:

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Spectral technique in electronic circuit analysis
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Microwave and Optical Technology Letters, 1988
Electrical Performance of High-Speed Interconnect Systems
IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1987
Time-domain response of multiconductor transmission lines
Proceedings of the IEEE, 1987
Analysis of Lossy Transmission Lines with Arbitrary Nonlinear Terminal Networks
IEEE Transactions on Microwave Theory and Techniques, 1986
Multiconductor Transmission Lines In Multilayered Dielectric Media
IEEE Transactions on Microwave Theory and Techniques, 1984
Coupled Lossy Transmission Line Characterization and Simulation
IBM Journal of Research and Development, 1981
Formulas for the Skin Effect
Proceedings of the IRE, 1942

Cited by 5 articles