A Scanning Soft X-Ray Microscope Using Normal Incidence Mirrors
- 1 January 1984
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Status Of The Zone Plate MicroscopePublished by SPIE-Intl Soc Optical Eng ,1982
- Surface Profiling By Electro-Optical Phase MeasurementsPublished by SPIE-Intl Soc Optical Eng ,1982
- The Atomic Scattering Factor, f1+if2, for 94 Elements and for the 100 to 2000 eV Photon Energy RegionAIP Conference Proceedings, 1981
- High Resolution X-Ray Optics For Astronomical And Laboratory SourcesPublished by SPIE-Intl Soc Optical Eng ,1977