VSM profiling of CoCr films: A new analytical technique
- 1 September 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 20 (5), 812-814
- https://doi.org/10.1109/tmag.1984.1063365
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Magnetic and structural characteristics of ion beam sputter deposited Co-Cr thin filmsIEEE Transactions on Magnetics, 1983
- Magnetic properties and microstructure of CoCr based vertical recording materials prepared by ion beam sputteringJournal of Magnetism and Magnetic Materials, 1983
- Co-Cr films with perpendicular magnetic anisotropyIEEE Transactions on Magnetics, 1981
- Co-Cr recording films with perpendicular magnetic anisotropyIEEE Transactions on Magnetics, 1978
- Versatile and Sensitive Vibrating-Sample MagnetometerReview of Scientific Instruments, 1959