Atomic Force Microscopy and Kelvin Probe Force Microscopy Evidence of Local Structural Inhomogeneity and Nonuniform Dopant Distribution in Conducting Polybithiophene
- 1 January 1996
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry
- Vol. 100 (48), 18603-18606
- https://doi.org/10.1021/jp960844y
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Concentration distribution of conducting species with time resolution in electrochemical undoping process at the polypyrrole-film-coated electrode in the light of electric percolationJournal of Electroanalytical Chemistry, 1995
- An Atomistic Investigation of Helical PolythiopheneMolecular Simulation, 1995
- Two-dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopyJournal of Applied Physics, 1995
- Inhomogeneous disorder and the modified Drude metallic state of conducting polymersSynthetic Metals, 1994
- Redox switching of polyaniline films: Low temperature studiesSynthetic Metals, 1993
- Photographic measurements of propagation speeds of the conducting zone in polyaniline films during electrochemical switchingJournal of Electroanalytical Chemistry, 1992
- Scanning tunneling microscopy (STM) evidence of semicrystalline and helical conducting polymer structuresThe Journal of Physical Chemistry, 1990
- Scanning tunneling microscopy of polythiophene, poly(3-methylthiophene), and poly(3-bromothiophene)The Journal of Physical Chemistry, 1990
- Two helical conformations of polythiophene, polypyrrole, and their derivativesPhysical Review B, 1989
- Scanning tunneling microscopic imaging of electropolymerized, doped polypyrrole: visual evidence of semicrystalline and helical nascent polymer growthThe Journal of Physical Chemistry, 1989