An application of Rutherford scattering to target thickness measurements
- 15 August 1968
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 63 (3), 353-354
- https://doi.org/10.1016/0029-554x(68)90599-5
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Crystal oscillator film thickness monitorNuclear Instruments and Methods, 1964