Applications of Kikuchi Line Analyses in Electron Microscopy
- 1 December 1964
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 35 (12), 3614-3616
- https://doi.org/10.1063/1.1713282
Abstract
The usefulness of Kikuchi line diffraction patterns for electron microscopy experiments is demonstrated. Examples are given of the determination of exact foil orientation, the calibration of tilting stages, and the determination of the magnitude of the deviation parameter s from the exact Bragg condition.Keywords
This publication has 4 references indexed in Scilit:
- Electron Microscopy and Diffraction of Thin Films: Interpretation and Correlation of Images and Diffraction PatternsPhysica Status Solidi (b), 1964
- The determination of the sense of the burgers vector of a dislocation from its electron microscope imagesPhilosophical Magazine, 1962
- Diffraction contrast of electron microscope images of crystal lattice defects. III. Results and experimental confirmation of the dynamical theory of dislocation image contrastProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1962
- The Interpretation and Application of Electron-Diffraction "Kikuchi-Line" Patterns - Part II. The Methods of Indexing the PatternsProceedings of the Physical Society, 1948