Mass Analysis of Sputtered Particles
- 1 August 1963
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 34 (8), 2489-2490
- https://doi.org/10.1063/1.1702772
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Isotopic Abundance Determination of Copper by SputteringJournal of Applied Physics, 1962
- On the Yield and Energy Distribution of Secondary Positive Ions from Metal SurfacesJournal of Applied Physics, 1960
- Secondary Positive Ion Emission from Metal SurfacesJournal of Applied Physics, 1959
- Sputtering of Surfaces by Positive Ion Beams of Low EnergyJournal of Applied Physics, 1958
- Systematic investigation of a magnetic ion source for an electromagnetic isotope separatorNuclear Instruments, 1957
- A Mass Spectrometer for Isotope and Gas AnalysisReview of Scientific Instruments, 1947