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Exploiting the Dual Nature of Sensitivity Labels
Home
Publications
Exploiting the Dual Nature of Sensitivity Labels
Exploiting the Dual Nature of Sensitivity Labels
JW
John P. L. Woodward
John P. L. Woodward
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1 April 1987
proceedings article
Published by
Institute of Electrical and Electronics Engineers (IEEE)
https://doi.org/10.1109/sp.1987.10016
Abstract
No abstract available
Cited by 18 articles