Fixed Charge Density ( Q ss ) at the Si ‐ SiO2 Interface for Thin Oxides

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1 August 1982

journal article
Published by The Electrochemical Society in Journal of the Electrochemical Society

Vol. 129 (8), 1757-1760
https://doi.org/10.1149/1.2124287

Abstract

No abstract available

Cited by 23 articles