High resolution studies of NiSi2 ultrathin film formation by ion scattering and cross-section tem
- 1 May 1985
- journal article
- Published by Elsevier in Surface Science
- Vol. 154 (1), 52-69
- https://doi.org/10.1016/0039-6028(85)90351-6
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
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