A model for analysis and quantification of ion scattering spectroscopy data
- 1 September 1990
- journal article
- Published by Elsevier in Surface Science
- Vol. 235 (1), 60-66
- https://doi.org/10.1016/0039-6028(90)90106-i
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Surface analysis using ion scattering spectroscopy: effect of resolution and intensity measure on surface atom density ratiosAnalytical Chemistry, 1988
- Summary Abstract: Semiempirical modeling of the background in low energy ion scattering spectraJournal of Vacuum Science & Technology A, 1986
- Mechanism of electron exchange between low energy He+ and solid surfacesSurface Science, 1985
- Study of low energy noble gas ion reflection from monocrystalline surfaces; Influence of thermal vibrations of the surface atoms: IV. Possibilities for the estimation of the actual ion-atom interaction potentialSurface Science, 1977
- Study of low energy noble gas ion reflection from monocrystalline surfaces; influence of thermal vibrations of the surface atoms: III. A qualitative comparison of experimental and calculational resultsSurface Science, 1977
- Study of low energy noble gas ion reflection from monocrystalline surfaces; Influence of thermal vibrations of the surface atoms: II. Calculational evaluation of the sensitivity for model parameters and possibilities for estimationSurface Science, 1976
- Study of low energy noble gas ion reflection from monocrystalline surfaces; influence of thermal vibrations of the surface atoms: I. Computer simulation of energy and spatial distributionsSurface Science, 1976