Chemical bond and related properties of SiO2 III. Core-level shifts in SiOx
- 16 August 1977
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 42 (2), 501-509
- https://doi.org/10.1002/pssa.2210420211
Abstract
No abstract availableKeywords
This publication has 41 references indexed in Scilit:
- Chemical bond and related properties of SiO2. II. Structural TrendsPhysica Status Solidi (a), 1977
- Chemical bond and related properties of SiO2 I. character of the chemical bondPhysica Status Solidi (a), 1977
- X-ray photoelectron spectroscopy of thermally grown silicon dioxide films on siliconChemical Physics Letters, 1975
- Electrical conduction in evaporated silicon oxide filmsThin Solid Films, 1969
- Structure of Silicon MonoxideJournal of the Electrochemical Society, 1969
- Poole-Frenkel Effect and Schottky Effect in Metal-Insulator-Metal SystemsPhysical Review B, 1967
- Dielectric Properties and DC Conductivity of Vacuum-Deposited SiO FilmsJapanese Journal of Applied Physics, 1964
- Properties of Evaporated Thin Films of SiOJournal of the Electrochemical Society, 1963
- Zur Kenntnis der SiO- und Si 2 O 3 -Phase in Dünnen SchichtenOptica Acta: International Journal of Optics, 1962
- A Study of Amorphous SiOThe Journal of Physical Chemistry, 1959