Hall effect measurements on silicon inversion layers
- 17 April 1978
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 66 (1), 65-66
- https://doi.org/10.1016/0375-9601(78)90106-8
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Disorder-induced carrier localization in silicon surface inversion layersApplied Physics Letters, 1974