Analytical redundancy and the design of robust failure detection systems
- 1 July 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Automatic Control
- Vol. 29 (7), 603-614
- https://doi.org/10.1109/tac.1984.1103593
Abstract
The failure detection and identification (FDI) process is viewed as consisting of two stages: residual generation and decision making. It is argued that a robust FDI system can be achieved by designing a robust residual generation process. Analytical redundancy, the basis for residual generation, is characterized in terms of a parity space. Using the concept of parity relations, residuals can be generated in a number of ways and the design of a robust residual generation process can be formulated as a minimax optimization problem. An example is included to illustrate this design methodology.Keywords
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