Comparison of the CKLL first-derivative auger spectra from XPS and AES using diamond, graphite, SiC and diamond-like-carbon films
- 1 April 1987
- journal article
- Published by Elsevier in Surface Science
- Vol. 182 (3), 431-438
- https://doi.org/10.1016/0039-6028(87)90011-2
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- Non-destructive surface analysis by the 1st-derivative spectra of X-ray excited Auger electron.SHINKU, 1986
- Preparation of sp3-Rich Amorphous Carbon Film by Hydrogen Gas Reactive RF-Sputtering of Graphite, and Its PropertiesJapanese Journal of Applied Physics, 1984
- Surface analysis of diamondlike carbon filmsJournal of Vacuum Science & Technology A, 1983
- Auger lineshape analysis of carbon bonding in sputtered metal-carbon thin filmsSurface Science, 1983
- Electron spectroscopy of the diamond surfaceApplied Physics Letters, 1981
- Electron spectroscopy of ion beam and hydrocarbon plasma generated diamondlike carbon filmsJournal of Vacuum Science and Technology, 1981
- The diamond surface: II. Secondary electron emissionSurface Science, 1977
- The diamond surface: I. The structure of the clean surface and the interaction with gases and metalsSurface Science, 1977
- Chemical Effects in Auger Electron SpectroscopyJournal of Applied Physics, 1972
- Smoothing and Differentiation of Data by Simplified Least Squares Procedures.Analytical Chemistry, 1964